Single layer fits of XRR measurements of softmatter thinfilms¶
This is a compiled dataset of raw X-ray reflectivity (XRR, reflectometry) measurements together with corresponding fit parameters, intentionally published to use as training or test data for machine learning models.
Authors & Contributors¶
- Alesandro Greco
- Linus Pithan
- Stefan Kowarik
- Ingrid Dax
- Nadine Rußegger
- Alexander Gerlach
- Alexander Hinderhofer
- Frank Schreiber
The initial dataset has been compiled by A. Greco and prepared for publication by L. Pithan.
Data structure¶
All data is provided in an hdf5 file, following NeXus convention with respect to the provided metadata in the hdf5 attributes. The datesets have been measured in-situ and therefore there are always stacks of curves that correspond to the different layer thicknesses of the same material on top of $SiO_x$. The measured data is provided under experimental and the corresponding fit parameters under fit. Additional information is collected in metadata.
Layer model¶
The following model was used:
| Air | |
|---|---|
| layer 1: thickness, roughness and SLD fitted | |
| $SiO_x$: thickness, roughness and SLD kept constant for each stack | |
| $Si$: roughness and SLD kept constant |
Limited q-range of fits¶
🔴 For all provided fits the q-range during fitting was limited form $q_{min} = 0.02 {\mathring{A}}^{-1}$ to $q_{max} = 0.15 {\mathring{A}}^{-1}$.
